Advanced Surface Metrology

Advanced Surface Metrology

A range of products manufactured by Bruker in the USA providing advanced surface measurement and inspection for research and production facilities. These products include white light interferometric (WLI) and confocal technology and provide fast, non-contact analyses for samples ranging in size from microscopic MEMS to entire engine blocks. Bruker's profilometry solutions support a vast range of applications in research, product development, quality control and failure analysis.

ContourGT 3D Optical Microscopes - a range of systems combining advanced 64-bit, multi-core control and powerful analysis software. They are very user friendly and incorporate patented white light interferometric (WLI) hardware, making them among the most advanced 3D optical surface profilers ever developed. The ContourGT range consists of the following models:-
  • ContourGT-K0 (Entry Level)
  • ContourGT-K1 (Bench-top model)
  • ContourGT-X3
  • ContourGT-X8
  • ContourGT-X8 PSS (Production Configuration)
The capabilities and functionality of each model has been optimised to ensure a wide range of industry applications are addressed such as precision machining, solar cells, ophthalmic lenses, semiconductor devices, hard disk drives, automotive, and orthopedics.


Download the ContourGT Brochure

NPFLEX 3D Surface Metrology System - provides very flexible, non-contact 3D surface characterisation for large samples, such as orthopedic medical implants and large, unusual parts routinely seen in aerospace, automotive and precision engineering applications. Based on white-light interferometry, the NPFLEX provides data density, resolution, and repeatability beyond what is possible with contact instrumentation. An open-gantry design enables over 300° of access to surfaces previously too difficult to analyse due to size or part orientation. The NPFLEX gives superior flexibility, accuracy, and throughput for precision manufacturing enabling tighter tolerances and more efficient processes.

Features include:
  • 330mm vertical capacity
  • Optional swivel head
  • Multi-variable analysis
  • Interferometry providing sub-nanometer vertical resolution
  • Rapid data acquisition
  • Minimal measurement setup
  • Large field of view

Download the NPFLEX 3D Brochure

If you would like to make an enquiry, contact Metrology Direct on +44 (0)1452 725241 or use our enquiry form.

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