WAVELINE - Roughness and Contour Metrology
Tactile roughness measurement
- Roughness parameters
- Core roughness parameters
- Profile parameters
- Waviness parameters
- Motif parameters
- JIS parameters
- Topography evaluation
- Dominant waviness
- Twist parameters
Tactile roughness measurement
- Roughness parameters
- Core roughness parameters
- Profile parameters
- Waviness parameters
- Motif parameters
- JIS parameters
- Topography evaluation
- Dominant waviness
- Twist parameters
Optical surface inspection
- Crosshatch angles
- Area of blowholes
- Radius
- Laser honing structures
Surface roughness measurement on a wide range of surfaces
Wide range of evaluation possibilities in contour measurement
Roughness measurement
Contour measurement
Combined roughness and contour measurement
Surface inspection
Get better measurements
… with versatility
Whether mobile or stationary, manual or automated, for simple or complex measuring tasks – we supply you with measuring systems that are tailored to your needs.
… in day-to-day operations
Our robust and high-precision solutions provide absolutely precise results in environments close to production. Our systems are easy to operate thanks to an intuitive software interface.
… with flexibility
The WAVELINE systems can be optimally configured to suit a wide range of requirements as needed, with exchangeable probe arms and a comprehensive range of accessories. As a result, these systems are also suitable for different measuring tasks on flexible production lines
… with professional metrology
WAVELINE solutions are the direct result of decades of experience and extensive expertise. They stand out from other products on the market thanks to measurements performed in accordance with international standards, simple operation, and professional evaluation of the measured values.
… with modern technology
Mobile WAVELINE solutions feature wireless Bluetooth® technology allowing an almost limitless range of applications. In contour measurement, digital probing systems ensure reliable measurement results without analog limitations.
… with innovative probing systems
Thanks to intelligent probing systems, the correct measuring conditions are automatically set for contour measurements. It is also possible to measure with dual tip probe arms for top/bottom measurements.
Stationary roughness and/or contour measurement with separate probing systems
HOMMEL-ETAMIC C8000 digital
Compact and precise contour measuring systems
HOMMEL-ETAMIC C8000 digiscan
Contour measuring systems with electronic probe arm recognition
HOMMEL-ETAMIC T8000 RC
Combined roughness and contour systems
Combined roughness and contour measurement with one probing system
HOMMEL-ETAMIC surfscan
High resolution roughness and contour measurement in one run
HOMMEL-ETAMIC nanoscan 855
Simultaneous roughness and contour measurement in the nanometer range





